
作者Alan Hastings具有渊博的集成电路版图设计知识和丰富的实践经验。本书以实用和权威性的观点全面论述了模拟集成电路版图设计中所涉及的各种问题及目前的最新研究成果。书中介绍了半导体器件物理与工艺、失效机理等内容;基于模拟集成电路设计所采用的3种基本工艺:标准双极工艺、CMOS硅栅工艺和BiCMOS工艺,重点探讨了无源器件的设计与匹配性问题,二极管设计,双极型晶体管和场效应晶体管的设计与应用,以及某些专门领域的内容,包括器件合并、保护环、焊盘制作、单层连接、ESD结构等;最后介绍了有关芯片版图的布局布线知识。 本书可作为相关专业高年级本科生和研究生教材,对于专业版图设计人员也是一本极具价值的参考书。 1 Device Physics 1.1 Semiconductors 1.2 PN Junctions 1.3 Bipolar Junction Transistors 1.4 MOS Transistors 1.5 JFET Transistors 1.6 Summary 1.7 Exercises2 Semiconductor Fabrication 2.1 Silicon Manufacture 2.2 Photolithography 2.3 Oxide Growth and Removal 2.4 Diffusion and Ion Implantation 2.5 Silicon Deposition and Etching 2.6 Metallization 2.7 Assembly 2.8 Summary 2.9 Exercises3 Representative Processes 3.1 Essential Features 3.2 Fabrication Sequence 3.3 Available Devices 3.4 Summary 3.5 Exercises4 Failure Mechanisms 4.1 Electrical Overstress 4.2 Contamination 4.3 Surface Effects 4.4 Parasitics 4.5 Summary 4.6 Exercises5 Resistors 5.1 Resistivity and Sheet Resistance 5.2 Resistor Layout 5.3 Resistor Variation……6 Capacitors and Inductors 7 Matching of Resistors and Capacitors8 Bipolar Transistors9 Applications of Bipolar Tansistors10 Diodes11 Field-Effect Transistors12 Applications of MOS Transistors13 Special Topics14 Assembling the DieAppendicesIndex
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